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Inspection Microscopes

Scitech
SciTech offers products and systems in the area of imaging and analysis for the biomedical, physical science and industrial markets. They offer a wide range of scientific cameras, camera accessories and illumination systems, microscopy systems, atomic ...
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ISSCO are specialists in Microscopes Imaging, Microscope Software, Fibreoptics, Spectroscopes, Lamps and Globes.
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Olympus Australia manufacture a range of professional opto-digital products, Olympus pioneers key technologies in the fields of imaging and voice products, endoscopy, microscopy, bioanalytics and diagnostics.
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All radio products including coaxial assemblies and gps.
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Testequip are suppliers of all types of inspection, measurement, NDT and materials testing equipment, specialising in supplying and sourcing a range of high technological and scientific equipment. Products include abrasion testers, coating thickness, ...
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We have Fully Authorized and Factory backed service facility with factory trained technicians ready to service your Topcon equipment. Please come into our modern office to have your Instruments calibrated and enjoy a fresh coffee while you wait.
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Opto Electronic devices
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NanoScience atomic force microscope
Supplier news
04/05/11 - Following the launch of its latest BioScience microscope, Scitech has announced a new version of the company’s NanoWizard NanoScience atomic force microscopes.
TE-220 digital USB microscopes are ideal for a range of inspection applications
Supplier news
04/04/11 - Testequip is pleased to introduce the TE-220 digital USB microscope that has magnification up to 220x and is supplied with a steel boom stand.
Supplier news
29/04/08 - Dynmast manufactures quality cable assemblies, antenna's and RF equipment for various industries and government organisations.
Supplier news
22/01/03 - RESPONDING to demands in the confocal microscopy industry, Piezosystem Jena, represented by Lastek, has introduced a new longer travel stage for focusing microscope objectives. The new stage, the MIPO
pco – Dimax CS  Crash Test High Speed Camera System
The pco.dimax cs camera is specially designed for all applications centered around car safety testing involving onboard, offboard and sled testing. A unique capability of all pco.dimax systems is the built-in automatic image calibration that requires ...
Scitech
JPK Instruments – Optical Tweezers NanoTracker Multiplexing
This video shows how many optical traps can be generated from a single laser source by rapidly scanning the laser across many positions, a process called multiplexing. This multiplexing is in a way similar to juggling: not all objects are manipulated ...
Scitech
MBF Bioscience – Stereology with Stereo Investigator
Stereo Investigator has been cited in 6,114 papers— 5 times more than any other stereology system. It is an integral component of ongoing work in numerous fields, and it has contributed to recent advances in disease research, including Alzheimer's, Parkinson's, ...
Scitech
Anasys Instruments – nanoIR2 - True, model free nanoscale IR
Introducing nanoIR2™, the nanoscale IR spectroscopy platform. The breakthrough nanoIR2 system features top-side illumination which greatly
Scitech
Scientifica - Multiphoton Imaging System
Scientifica is offering you a compact, cost-effective and modular 2-Photon & Multiphoton Imaging system that offers superb return-on-investment.
Scitech
JPK Instruments – Atomic Force Microscopy JPK BioMat
The BioMAT™ workstation from JPK Instruments is designed for the study of opaque samples combining upright optical microscopy with atomic force microscopy (AFM) for surface science and life science. This animation illustrates the design principle.
Scitech
Scientifica - LASU  Optogenetics, photostimulation and uncag
The LASU (Laser Applied, Stimulation and Uncaging) system is perfect for users engaging in optogenetics, uncaging or other photostimulation experiments.
Scitech
ASI - Dual-View Inverted Selective Plane Illumination (diSPI
ASI - Dual-View Inverted Selective Plane Illumination (diSPIM)
Scitech
JPK Instruments – Atomic Force Microscopy JPK Nanowizard
Using the example of the NanoWizard®II atomic force microscope (AFM), this animation illustrates that only a tip-scanning AFM such as the NanoWizard®I, II or 3 from JPK Instruments truly enables simultaneous AFM and optical microscopy measurements.
Scitech
Nanofocus - µsurf: 3D surface measurement
Learn more about the patented confocal technology with this animation. Understand how the industry-suited µsurf confocal microscopes work and how you can analyze your surfaces three-dimensionally with high resolution within seconds
Scitech
GW Instruments – instruNet Data Acquisition System
GW Instruments – instruNet Data Acquisition System
Scitech
Image Metrology – Particle & Pore Analysis in SPIP
With the Particle & Pore Analysis Module in SPIP you can easily detect and quantify particles, pores, grains, and other image features with boundaries. You can detect features of any shape and size on virtually any surface.
Scitech

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