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NDT Equipment Sales
NDT Sales Equipment is the exclusive distributor of Vidisco Ltd.
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Gamma Solutions
Gamma Solutions offers advanced mobile data collection solutions. They provide printers, barcode systems, portable terminals, scanners, wireless networks, RFID systems and implementation services.
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Scitech
SciTech offers products and systems in the area of imaging and analysis for the biomedical, physical science and industrial markets. They offer a wide range of scientific cameras, camera accessories and illumination systems, microscopy systems, atomic ...
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Established in 1992, NDT Equipment Sales is a leading supplier of equipment and consumables to the non-destructive testing industry. Based in Sydney, NDT Equipment Sales supply nationally and internationally to a wide variety of clients, including ...
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High-speed and high-resolution camera specialists
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Small compact high-speed cameras from Scitech
Supplier news
08/12/09 - The IDT Redlake MotionXtra N-series from Scitech are compact, self contained high speed cameras with very light-sensitive proprietary CMOS sensors of 1, 1.3 or 4 Megapixel and with speeds up to 4000fps at full resolution.
Supplier news
29/10/08 - Photron’s multi head Fastcam MH4, available from Measurement & Analysis Camera Systems, has four camera heads, each less than 1.5” square that can be connected to the compact DC processor to enable easy high speed imaging in the most difficult to access ...
SciTech introduces new QImaging Retiga-4000RV CCD digital camera
Supplier news
06/10/06 - The new QImaging Retiga-4000RV CCD digital camera, available from SciTech, has been specially engineered for low-light, high-dynamic-range applications
pco – Dimax CS  Crash Test High Speed Camera System
The pco.dimax cs camera is specially designed for all applications centered around car safety testing involving onboard, offboard and sled testing. A unique capability of all pco.dimax systems is the built-in automatic image calibration that requires ...
Scitech
JPK Instruments – Optical Tweezers NanoTracker Multiplexing
This video shows how many optical traps can be generated from a single laser source by rapidly scanning the laser across many positions, a process called multiplexing. This multiplexing is in a way similar to juggling: not all objects are manipulated ...
Scitech
MBF Bioscience – Stereology with Stereo Investigator
Stereo Investigator has been cited in 6,114 papers— 5 times more than any other stereology system. It is an integral component of ongoing work in numerous fields, and it has contributed to recent advances in disease research, including Alzheimer's, Parkinson's, ...
Scitech
Anasys Instruments – nanoIR2 - True, model free nanoscale IR
Introducing nanoIR2™, the nanoscale IR spectroscopy platform. The breakthrough nanoIR2 system features top-side illumination which greatly
Scitech
Scientifica - Multiphoton Imaging System
Scientifica is offering you a compact, cost-effective and modular 2-Photon & Multiphoton Imaging system that offers superb return-on-investment.
Scitech
JPK Instruments – Atomic Force Microscopy JPK BioMat
The BioMAT™ workstation from JPK Instruments is designed for the study of opaque samples combining upright optical microscopy with atomic force microscopy (AFM) for surface science and life science. This animation illustrates the design principle.
Scitech
Scientifica - LASU  Optogenetics, photostimulation and uncag
The LASU (Laser Applied, Stimulation and Uncaging) system is perfect for users engaging in optogenetics, uncaging or other photostimulation experiments.
Scitech
ASI - Dual-View Inverted Selective Plane Illumination (diSPI
ASI - Dual-View Inverted Selective Plane Illumination (diSPIM)
Scitech
JPK Instruments – Atomic Force Microscopy JPK Nanowizard
Using the example of the NanoWizard®II atomic force microscope (AFM), this animation illustrates that only a tip-scanning AFM such as the NanoWizard®I, II or 3 from JPK Instruments truly enables simultaneous AFM and optical microscopy measurements.
Scitech
Nanofocus - µsurf: 3D surface measurement
Learn more about the patented confocal technology with this animation. Understand how the industry-suited µsurf confocal microscopes work and how you can analyze your surfaces three-dimensionally with high resolution within seconds
Scitech
GW Instruments – instruNet Data Acquisition System
GW Instruments – instruNet Data Acquisition System
Scitech
Image Metrology – Particle & Pore Analysis in SPIP
With the Particle & Pore Analysis Module in SPIP you can easily detect and quantify particles, pores, grains, and other image features with boundaries. You can detect features of any shape and size on virtually any surface.
Scitech

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