The GS610 for Semiconductor Testing is designed to carry out voltage/current analysis on two-lead or three-lead components including discrete semiconductors, integrated circuits and optoelectronic components, the new PC-based software works in conjunction with the USB-connected GS610 to enable source and sink operations at up to 100 V at 0.5 A or 12 V at 3.2 A. A single GS610 is required for two-lead components and two units are needed for three-lead components.
The GS610 for Semiconductor Testing is designed for ease of setup and operation, with screens guiding the user through the setup process and the selection of sweep range, graph axes, measurement range and measurement conditions.
Curves can be based on various combinations of current and voltage inputs along with time-stamp references. Sweep shape can be set to ramp (linear or logarithmic), triangular (linear or logarithmic) or rectangular, and the number of sweep points can be 5, 10, 20, 50, 100, 200 or 1000.
In addition to facilities for scaling and averaging, the unit offers a number of analysis features including cursor, zoom, scroll and reference curve designation. File operations include CSV data storage and loading, graphic image storage, panel image storage, and setup storage and recall.
The GS610 source-measure unit equipped with the new software is ideally suited to carrying out high-speed, high-accuracy real-time V/I curve tracing for the parametric testing of components such as discrete transistors and diodes, voltage regulator ICs, op amps, logic ICs, LEDs and solar battery cells.
This new curve-tracer software complements the earlier version for Yokogawa’s higher-specification GS820 multi-channel unit, which allows users to carry out tests on two or three leaded devices directly. By supporting the lower-cost GS610, Yokogawa is allowing users with restricted budgets to benefit from this sophisticated software.