Home > Westek Electronics supplies Teseq NSG 5071 inductive switch transient test circuits

Westek Electronics supplies Teseq NSG 5071 inductive switch transient test circuits

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article image Teseq NSG 5071 inductive switch transient test circuits

Teseq NSG 5071 test circuits from Westek Electronics are designed for automotive EMC testing applications, in accordance with Ford standard EMC-CS-2009.1 for test CI 220 pulses A1, A2-1, including inductive kick and oscillatory transients.

The adherence to this standard is rigorous, so that by incorporating the appropriate components as specified, these test circuits deliver reliable testing every time.

Many of these components are defined in the standard as critical with no substitutions allowed.

A Potter and Brumfield KUP-series relay and 5 micro Henry as well 100 micro Henry Osborne inductors are among the critical components in these test circuits, thus also providing delivery of a CI 260 waveform F.

The relay is used:

  • to switch the voltage off to inductors thus causing large inductive kickback transients
  • to self-chatter; and
  • in the case of Waveform F, to act as a randomised drop out test.

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