Home > E-field EMC immunity test for IC pins and tracks

E-field EMC immunity test for IC pins and tracks

Supplier News
article image The probe is ideal for EMC immunity testing.

THE new Langer E-field probe, model ES 08 D, capacitively couples high voltage burst pulses into IC pins and PCB tracks to enable highly specific EMC immunity testing on densely populated boards.

The method is invaluable in testing pre-production designs and in achieving economies by being able to minimise external filtering.

The Langer SGZ 21 burst generator 4kV max 5/50 nano-second pulses (compliant to EN 61000-4-4) and 2kV max 2/10 nano-second are injected via the probe, which has high common mode rejection.

It is available from Westek Electronics Pty Ltd .

Newsletter sign-up

The latest products and news delivered to your inbox