AFJ Test System for luminaries available from Westek Electronics
AFJ Test System
The new AFJ Test System for luminaires permits the testing of both electronic and traditional ballasted luminaires, including those with switch-type starter circuits.
Conducted and radiated interference effects can be measured. Conducted RFI is analysed utilising a LISN and radiated interference is measures using a van Veen loop antenna comprising of three orthogonally arranged loops enclosing a platform on which the DUT is situated.
Central to the AFJ testing arrangement is the ER55 super heterodyne measurement receiver.
The main features include peak, quasi-peak and AV detectors (the latter two operating simultaneously), corrected pulse weighting according to CISPR 16-1, measuring bandwidths of 200 Hz, 9 kHz, 120 kHz, (and 1 MHz in the case of the 3 GHz model ER55CR), built-in AM and FM demodulation, built-in tracking generator including insertion loss measurement according to CISPR 15 and a powerful CPU with 1 Mbyte dynamic memory.
The receivers incorporate a pulse limiter/attenuator which protects the high sensitivity preamplifier stages from spikes that might occur during conducted interference tests.
The AFJ receivers are equipped for LAN and Internet remote control, on-line calibration and firmware upgrades can be accessed remotely.
The new open software available for the AFJ measurement receivers permit spectrum analysis in accordance with CISPR 16-1 and other various military standards. Full automation such as the control of turntables and antenna masts are also easily achieved.
AFJ Test System for luminaries is available from Westek Electronics.
9-Jan-2008