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Warsash Scientific releases new atomic force microscopes

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article image XE15 atomic force microscope

Warsash Scientific introduces the new XE15 atomic force microscopes (AFM) from Park Systems.

Powerful and versatile, the new XE15 large sample AFM provides researchers and operators with the ability to automatically image and measure up to nine individual samples. The AFM is ideally suited for shared lab environments that handle a diverse range of samples, researchers doing multi-variant experiments, and failure analysis engineers working on wafers.

Featuring a unique MultiSample scan, the XE15 can easily scan larger samples of up to 200mm x 200mm, maximising the efficiency of product use through automated imaging of multiple samples in one pass. 

A specially designed multi-sample chuck holds up to nine individual samples allowing operators to scan the samples under identical environmental conditions, improving the accuracy and reliability of the data. After loading the stage with multiple samples, the scan process can be initiated, making it ideal for researchers wanting to scan larger samples or failure analysis engineers who need to place silicon wafers on the stage.

Key features of the XE15 atomic force microscopes include convenient sample measurements; accurate scans with crosstalk elimination; better tip life; sample preservation; true non-contact mode; user-friendly design and interface; and versatile range of modes and options.

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