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Warsash Scientific
Unit 7 The Watertower, 1 Marian St
Redfern NSW 2016
Tel: 02 9319 0122
Fax: 02 9318 2192

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Filmetrics F20 Thin Film Measurement System.


Product/Service Name

Filmetrics F20 Thin Film Measurement System.



Function/Applications
Filmetrics is the leader in affordable and easy-to-use film measurement instruments for measuring film thickness (30 angstrom to 450 micron with resolution to 2 angstrom), refractive index and deposition rates. The Filmetrics F20 film measurement systems are capable of measuring the thicknesses of optically transparent films and materials. Applications include: optical coatings (hard coatings, anti-reflection coatings and filters), semiconductor fabrication (photoresists, oxides and nitrides), liquid crystal displays (cell gaps, polymers, ITO). The Filmetrics film measurement systems are capable of measuring the thickness of layers deposited on both reflective and transparent substrates such as silicon, GaAs, glass, aluminium and polycarbonate.

Differentiating Features
Filmetrics film measurement products operate on the principle of spectral reflectance. The advantage of this technique is that it provides the user with information on the thickness, refractive index and extinction coefficient of the film without the need for complex setups (as required in the case of an ellipsometer). Filmetrics have developed user-friendly software with an intuitive graphical interface which enables use of the film measurement system by both novice and the experienced technician alike. The F20 Thin Film Measurement System comes in a range of models to suit a number of different applications, these models include:

F20: General purpose instrument for measuring thicknesses up to 5 micron.
F20-EXR: Extended range system for measuring thicknesses up to 10 micron.
F20-XT: System for measuring thick films up to 450 micron thickness as encountered in MEMS, SOI, flip chips and thick polymers.
F20-HC: System designed for measuring thickness of hard-coats on lenses and headlights. This system includes a contact probe for spot measurements on curved surfaces.


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