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Nanovea 3D non-contact profilometers from Scitech

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Scitech  presents the Nanovea 3D non-contact profilometers designed with leading edge optical pens using superior white light axial chromatism.
Nanovea 3D non-contact profilometers are capable of measuring transparent, opaque, specular, diffusive, polished or rough materials across multiple applications using a large range of optical pens. Nanovea optical pens have zero influence from sample reflectivity, and variations require no sample preparation and also have advanced ability to measure high surface angles.
The profilometers, unlike other optical measurement techniques allow large surface areas to be precisely measured without any imaging stitching. For applications exceeding the profilometer’s capability, AFM integration is available to maximise measurement range. Nanovea PRVision software is optional on most profilometers for auto pattern recognition.
Speeds of the Nanovea 3D non-contact profilometers range from 7mm/s to 1m/s for laboratory or research to hi-speed inspection on large surface areas. Nanovea profilometers can be customised for size, speeds, scanning capabilities and Class 1 Clean Room compliance among others.
Key features of Jr25 optical profilometers: 

  • True portable non contact 3D measurement capabilities
  • Provides measurement capability for field study and production environments where samples cannot be moved
  • Utilises leading edge optical pens using superior white light axial chromatism measurement
  • Weighs less than 5.5kg, allowing the operator to safely place the unit onto the surface under inspection
  • Measures an area up to 25mm x 25mm, depth up to 27mm and resolution down to 5nm
  • Fully rotational single axis head allows measurement of surfaces at difficult angles
  • Pen scanning head can also be used to integrate on automated arms and other equipment
Key features of Ps50 optical profilometers: 

  • Ideal choice to replace stylus and laser profilers
  • Small footprint (30 x 25 x 27cm) and laptop option ideal for easy moving and installation in restricted spaces
  • 6” x 6” sample stage accommodates multiple and/or larger samples
  • Ideal option for budget limitations and small research facilities
Key features of ST400 optical profilometers: 

  • 150mm X-Y stages and large coarse height adjustment easily accommodate larger sample sizes and scan areas
  • Standard and piezo staging option available
  • Optional offset microscope or video zoom camera with manual or motorised zooms to easily identify small features prior to measuring them
  • Optional AFM integration to expand full measurement capability
  • Custom unit allows for the addition of larger X-Y stages to measure even larger areas
  • Available with various automation options
  • PRVision Image Pattern Recognition
Key features of HS1000 optical profilometers: 

  • Utilises leading edge optical pens using superior white light axial chromatism
  • Nano through macro range automatically obtained during measurement on a wider range of geometries and materials
  • Large range of optical pens can precisely measure an endless range of optical inspection applications
  • Zero influence from sample reflectivity with variations requiring no sample preparation
  • Large surface areas can be precisely measured without any imaging stitching

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