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Nanosurf LensAFM atomic force microscopes from Scitech

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article image Nanosurf LensAFM atomic force microscope
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Scitech  presents the Nanosurf LensAFM, a new line of atomic force microscopes that can be used in place of a normal objective lens on almost any optical microscope or 3D profilometer.
Significantly extending the resolution and measuring capabilities of optical microscopes and 3D profilometers, the LensAFM add-on not only provides 3D surface topography information but can also be used to analyse various physical properties of a measurement sample.
Nanosurf LensAFM atomic force microscopes find use in various measurement applications including roughness measurements, defect analysis, sharp edge radius, step heights, and material properties including hardness variations, conductance/ resistance and magnetism.
Typical areas of application include research and development, teaching and training, and quality assurance.
Key features and benefits of Nanosurf LensAFM atomic force microscopes: 

  • Mountable on virtually any optical microscope or 3D optical profilometer
  • Equipped with a quality objective lens for a clear view of the sample and AFM cantilever
  • Simple sample positioning using the optical microscope’s view finder and position manipulators
  • Integrated motor for automated cantilever approach
  • Large AFM Z-range allows measurement of high structures
  • All standard AFM modes available through the modular easyScan 2 controller
  • Intuitive operation

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