Scientific Solutions has reached an exclusive distribution agreement with JA Woollam Co Inc, USA, manufacturers of spectroscopic ellipsometers for non-destructive thin film and bulk material characterisation.
Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characterisation of all types of materials such as dielectrics, semiconductors, metals, organics and more.Scientific Solutions provides ellipsometers covering a spectral range to meet any need (from the vacuum UV to the far IR). Many upgrade options are available with Scientific Solutions’ ellipsometers namely automated sample translation, variable temperature (heating or cooling), focusing optics, liquid cells etc.
α-SE spectroscopic ellipsometer is a fast, low-cost ellipsometer for measuring film thickness and optical constants. Everything in the α-SE spectroscopic ellipsometer is contained in small table top package.
The α-SE spectroscopic ellipsometer is easy-to-use push button operation with advanced software takes care of the work for you.
The α-SE spectroscopic ellipsometer is a flexible instrument, capable of working on sample types such as dielectrics, semiconductors, organics and much more.
J A Woollam’s proven SE technology gives you both thickness and index without the uncertainty of single-? ellipsometry or spectrophotometry.
The α-SE spectroscopic ellipsometer breaks a performance/price barrier, which has never been approached before, providing the power of SE at a much lower cost than a high-level research tool. The α-SE spectroscopic ellipsometer is also fast, acquiring hundreds of wavelengths simultaneously in seconds for immediate results.
Scientific Solutions is the surface science instrumentation specialists with experience in supplying solutions for research and development and industrial measurement requirements.