Scientific Solutions has released IR-VASE Infrared variable angle spectroscopic Ellipsometre in Australia and New Zealand. This instrument is a perfect tool for applied research in semiconductors, polymers and much more.
Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k).
Spectroscopic ellipsometry is used for characterisation of all types of materials: dielectrics, semiconductors, metals, organics, and more.
We offer Ellipsometres covering a spectral range to meet any need (from the vacuum UV to the far IR). Many upgrade options are available with our Ellipsometres: automated sample translation, variable temperature (heating or cooling), focusing optics, liquid cells, etc.
IR-Vase - Infrared variable angle spectroscopic Ellipsometre features:
Spectral range: 2 to 30 microns
Rotating compensator (RCE) configuration
This configuration provides accurate "Delta" data from 0° to 360° as well as advanced measurement capabilities.
High precision automated angle capability
Highly accurate IR optical constants (n and k) from 2 to 30 microns
-reflected phase shift (direct measurement)
-Similar to FTIR spectroscopy, but with all the benefits of ellipsometry, particularly sensitivity to ultrathin films, opaque substrates, multilayers, etc
The IR-Vase acquires both ellipsometry and standard FTIR transmission measurements.