The single-channel model 2635 SourceMeter and dual-channel Model 2636 SourceMeter, available from Scientific Devices , are the newest members of Keithley's Series 2600 family of multi-channel I-V test solutions.
With 1fA measurement resolution, the models 2635 and 2636 SourceMeters are optimised for applications that require low current sourcing and measurement capabilities.
They are a suitable choice for semiconductor parametric analysis and test system.
Like the rest of the Series 2600 of SourceMeters, each half-rack, 2U instrument combines a precision power supply, a current source, 5½-digit millimetre, a voltage or current pulse generator with measurement, a low frequency arbitrary waveform generator, an electronic load and a trigger controller.
The analogue-to-digital converters provide simultaneous I and V measurements in less than 100µs (10,000rdgs/s) and source-measure sweep speeds of less than 200µs per point (5,500 points/s).
This high speed source-measure capability, plus advanced automation features and time-saving software tools, make the Series 2600 of SourceMeter instruments a suitable solution for I-V testing of a wide range of devices.
Applications:
- Semiconductor device characterisation, parametric analysis, reliability and wafer sort
- Low current testing of optoelectronic devices, sensors and discretes
- Research and education lab applications such as materials and dielectrics testing, Hall effect, and van der Pauw measurements
- Low power characterisation in nanotechnology research applications