Home > STMicroelectronics extends its range of radiation hardened devices

STMicroelectronics extends its range of radiation hardened devices

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article image ST’s new rad-hard devices combine proven 130nm process technology with dedicated chip architecture and layout rules to achieve superior radiation-immunity

STMicroelectronics Pty Ltd has added a series of LVDS drivers, receivers and multiplexers carrying the US 300krad QML-V qualification to its portfolio of radiation-hardened (rad-hard) devices.

Exceeding the performance of competing solutions, ST’s new rad-hard devices combine proven 130nm process technology with dedicated chip architecture and layout rules to achieve superior radiation-immunity and electrical characteristics. Supported by the French Centre National d'Etudes Spatiales (CNES) and the European Space Agency (ESA) for use in future commercial and government satellite projects, the ST devices are also QML-V qualified, enabling approval for use by space agencies and contractors worldwide.

According to Jean-Louis Venturin, Head of Section, Environment and Components at CNES, the collaboration of ST, ESA, and CNES in the development of rad-hard products for space has resulted in these high-performance devices, and they hope to see them added to the European Preferred Part List.

Jean-Francois Vadrot, STMicroelectronics Manager of the Aerospace & Hi-Rel Business Unit adds that the new LVDS devices have a complete set of radiation test reports and macromodels, including end-of-life and end-of-radiation, delivering a best-in-class solution that further strengthens ST’s offering for the worldwide aerospace market.

With over 35 years of experience in supporting government and commercial space programs worldwide, ST offers a growing portfolio of space- and hi-rel-qualified components including bipolar transistors and MOSFETs, voltage references, gate drivers, linear ICs, and power converters. 

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