A Renishaw inVia Raman microscope has been used in new breakthrough research to examine graphene films.
Conducted by an international team led by Oxford University scientists Professor Nicole Grobert and Adrian Murdock in collaboration with Renishaw plc and researchers from the Forschungszentrum Juelich (Germany) and University of Ioannina (Greece), the research addressed one of the major hindrances to the wider exploitation of graphene - the difficulty in growing large defect-free films.
The researchers used a Renishaw inVia Raman microscope to examine film thickness, strain and defects in graphene films.
Consisting of a single layer of carbon atoms, graphene was the first two-dimensional material to be discovered. Incorporating very interesting electronic and mechanical properties, graphene is one of the most conductive materials known to science and has a breaking strength 100 times greater than steel.
Typically, when graphene is grown using chemical vapour deposition (CVD), the individual graphene flakes merge with a variety of different orientations, creating defects. The researchers found that the orientation of the underlying copper substrate could be used to guide the graphene flakes so they were aligned, thereby preventing these defects.
According to team member Dr Tim Batten, Raman applications specialist at Renishaw, the inVia Raman spectrometer is a very powerful tool for investigating the properties of graphene, helping them have much better understanding of CVD graphene growth, which will be important for manufacturing graphene on an industrial scale.
In 2006, Professor Andrea Ferrari (University of Cambridge) used a Renishaw Raman spectrometer to conduct the first Raman characterisation of graphene. Since then, researchers worldwide have used data from Renishaw Raman systems in hundreds of scientific papers on graphene, greatly assisting in the understanding and development of this amazing material.
Renishaw Oceania represents the Renishaw Group in Australia.