THE new Chroma 11025 LCR/transformer tester and 11022 LCR component tester are provided with eight-level comparator bin sampling via their standard IEEE-488 handler interface.
DUTs can be subjected to signals from 50Hz to 100kHz. Parameters measured include L, C, R, X, modulus Z, phasor angle of Z, equivalent series resistance and loss and quality factors.
Available from Power Parameters , the Chroma 11025 also measures the transformer parameters including effective ratio, primary and secondary inductance and mutual inductance, as well as winding dc resistances.
Up to eight bin limits in %-variation can be programmed on Hi/pass/Lo basis.
A clear, easy-to-read display is provided via a 260 x 64 dot-matrix LCD.