Electro static discharge protection diodes
ROYAL Philips Electronics has released a new series of Electro Static Discharge (ESD) protection diodes designed to protect consumer and communications applications from ESD and other voltage induced transient pulses.
They have very low diode capacitance, very low leakage current and reverse stand voltages of 3.3V and 5.0V, all in extremely small packages. The new ESD protection diodes provide designers of space-constrained applications an excellent option for protection of electrical equipment both at the system and component level.
Semiconductors are becoming smaller, denser and more complex, particularly in space-critical applications such as portable devices, which increases the semiconductors' susceptibility to ESD pulses.
Several of Philips’ new diodes can be integrated into a device, making them well suited to these portable devices.
Philips' ESD protection diodes are designed to protect up to seven transmission or data lines from the damage caused by ESD pulses.
In high-speed data rate or high frequency applications too much protection device parasitic capacitance causes unintentional signal attenuation. Offering a low device capacitance down to 16 pF, Philips' new devices are ideal for ESD protection in these applications. The devices are also ideal for applications such as battery driven devices where power consumption is a key concern. With a low leakage current down to 50nA, the devices help lower overall power consumption in these applications.
Two new parts in the series, the PESD3V3L2UM and PESD5V0L2UM, are the first ESD protection devices on the market in the new leadless ultra small SOT883 surface mount package. The device footprint is 1.0mm x 0.6mm x 0.5mm, providing customers with printed circuit board savings of 90% compared to the SOT23 package traditionally used for ESD protection diodes. The new series of diodes can withstand ESD pulses up to 20kV and fulfills industry standard IEC 61000-4-2 (level 4), thus providing customers superior ESD
protection performance.
16-Jan-2004