Olympus Australia announces the new BTX Profiler, a stylish and functional benchtop unit that combines X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) analysis in a single instrument.
The BTX Profiler has been developed to provide affordable yet comprehensive compositional materials analysis at the structural and elemental level with the XRD and XRF combination delivering savings in operational costs, space, and time along with seamless integration of data and results.
A world-leading manufacturer of optical, electronic and precision engineering products, Olympus continues to be at the forefront of the development of X-ray analysis technology, which provides fast, non-destructive qualitative and quantitative characterisation of materials. Instruments developed by Olympus can be used for detection, identification and analysis of elements at a range of concentrations.
The BTX Profiler utilises the revolutionary XRD technology developed for the NASA Mars Science Laboratory program, where it is being deployed with great success aboard the Martian rover, Curiosity. Building on Olympus and NASA patents, the BTX Profiler also incorporates the highly acclaimed, award-winning, earthbound technology employed in Olympus' analytical X-ray instruments.
According to Andrew Taylor, Regional Sales Manager with Olympus, the BTX Profiler can be used in a wide range of applications including energy exploration, mineral identification, ore grade control, counterfeit drug screening, fire and explosives forensics, and corrosion monitoring.
Taylor explains the BTX Profiler’s full mineralogical and elemental analysis capabilities allow the instrument to be used for single sample measurement or for unattended multi-sample measurements when combined with an integrated autosampler.
The BTX Profiler is more efficient than conventional powder diffraction systems. The close-coupled transmission geometry means that the device only requires a low powered X-ray source and a small amount of sample. The sophisticated sample handling technology incorporates a patented vibration system that enables random crystal orientation in a fixed sample cell. The CCD detector with its smart energy discrimination provides graphical 2-D diffraction patterns, or Ring Patterns, and acquires more data more rapidly than conventional XRD detectors.
According to Taylor, development engineers are continually investigating different detectors, filtering techniques and analysis algorithms to improve the unit's sensitivity and accuracy. The Energy Dispersive XRF technology in the BTX Profiler integrates selectable optimised beam paths of a miniature X-ray tube and specialised filters; a large area silicon drift detector (SDD) for optimised resolution and detection limits; and close coupled geometry with the sample, allowing for a wide elemental and concentration measurement range.
The BTX Profiler’s non-destructive capability is of particular significance for several industrial sectors including energy, geochemistry, pharmaceuticals, catalysts, forensics and education.