National Instruments has introduced new PXI/PXIe-2543 solid state RF multiplexers to its product range, providing test engineers with a long lasting, high performance solution for optimising the routing of RF signals up to 6.6GHz.
These RF multiplexers feature a solid state architecture that allows for faster switching and more repeatable measurements when compared to traditional electromechanical switching solutions.
Suitable for use in a variety of high volume RF production test applications, including semiconductor and mobile device testing, these switches increase test throughput and provide long term measurement repeatability.
Charles Schroeder, director of test marketing at National Instruments, explains that "with this switch, automated test engineers can integrate and synchronize numerous PXI instruments, including RF generators and analysers, to get the most out of their test systems and further increase accuracy and throughput."
National's new PXI/PXIe-2543 solid state RF multiplexers also feature:
- 6.6 GHz dual 4x1 multiplexer for high-density RF switching, ideal for multisite test
- solid-state architecture for superior switch lifetime
- 50 Ohm termination on all channels for improved RF performance; and
- integrated PXI triggering for fast and repeatable measurements.