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New NI RF vector signal transceiver redefines instrumentation

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National Instruments Aust & NZ  introduces the NI PXIe-5644R RF vector signal transceiver (VST) that represents a new class of software-designed instrumentation.
 
The software-centric architecture of the NI PXIe-5644R enables engineers and scientists to use LabVIEW to tailor open FPGA-based hardware for their specific needs. Combining a vector signal generator and vector signal analyser with a user-programmable FPGA into a single PXI modular instrument, the new VST is ideal for testing the latest wireless and cellular standards such as 802.11ac and LTE.
 
Engineers can transform the vector signal transceiver into a new instrument or enhance its existing functionality using NI LabVIEW system design software.

According to Dr James Truchard, President, CEO and cofounder of National Instruments, NI redefined instrumentation with LabVIEW system design software 25 years ago, and is repeating it with the new RF vector signal transceiver.
 
Doug Johnson, director of engineering at Qualcomm Atheros explains that the NI PXIe-5644R RF vector signal transceiver provides instrumentation flexibility and to-the-pin control, which are critical for keeping their RF test process as efficient as possible.
 
Based on the performance gains from testing with NI's new vector signal transceiver, he believes that the NI PXIe-5644R provides the freedom and flexibility to develop their 802.11ac solutions for customers with significantly improved test throughput.

Key features of NI PXIe-5644R RF vector signal transceivers:  
 
  • Up to 6.0 GHz frequency coverage and 80 MHz instantaneous RF bandwidth
  • Industry-leading performance for testing the latest wireless standards such as 802.11ac and LTE
  • More than 10 times faster measurements than comparable solutions
  • Can replace multiple traditional instruments at a fraction of the cost and size
  • Built on FPGA technology programmable with LabVIEW
  • Easily expands to support multiple input, multiple output (MIMO) configurations or parallel testing in a single PXI chassis

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