National Instruments Aust & NZ has announced a series of technical seminars on RF and Microwave testing and design across Australia and New Zealand in March. The free events will explore the latest trends and technologies for RF and Microwave applications.
NI’s 2014 RF and Microwave Test and Design Roadshow is a series of free full-day seminars designed to educate and update engineers, researchers and technicians on the latest technological advances for the test and design of microwave and RF systems. The Roadshow will visit Sydney, Canberra, Adelaide and Melbourne in Australia, and Auckland in New Zealand.
RF experts from National Instruments and AWR will, in their presentations explore the functionality and capabilities of new technologies that are changing the way RF Test and Design applications including RF Record and Playback, RADAR, MIMO, and Spectrum Monitoring are being approached.
Seminar participants will also explore the architecture and advantages of software-defined, modular instrumentation, as well as learn about key considerations, time-saving tips and advanced testing techniques.
Featured sessions at each event location include: Revolutionising RF and Microwave Test and Design with a Modular Approach; Advanced Technologies for RF Record, Playback & MIMO Applications; Design Flow with AWR Microwave Office; Advanced VNA Measurements; Linking RF Design, Simulation and Test for Radar Applications; Introduction to Spectrum Monitoring Receivers; and What’s New in Microwave Office V11.
The free-to-attend event is designed for RF and microwave engineers and scientists involved in all phases of the product lifecycle from design and verification to production and field test.
Scheduled event locations for the NI’s 2014 RF and Microwave Test and Design Roadshow are: Sydney - 5 March; Canberra - 6 March; Auckland –12 March; Adelaide - 18 March; and Melbourne - 20 March.