Home > National Instruments Introduces 200 MHz Digital Instrument and High-Bandwidth Eight-Slot Chassis for Multimedia and Semiconductor Device Testing

National Instruments Introduces 200 MHz Digital Instrument and High-Bandwidth Eight-Slot Chassis for Multimedia and Semiconductor Device Testing

Supplier News
logo

Contact supplier

Your Email * indicates mandatory fields.
image

National Instruments  today introduced two new 32-channel PXI Express-based digital instruments and a new eight-slot high-bandwidth PXI Express 3U chassis for advanced automated test applications.

The NI PXIe-6544/45 selectable-voltage digital waveform generator/analyzers optimize test applications by supporting clock rates of up to 100 and 200 MHz, respectively. The NI PXIe-6545 provides typical streaming rates of 660 MB/s, making it one of the industry’s fastest-streaming digital test products. The new digital instruments make it easier for test engineers to conduct sophisticated analysis of high-speed semiconductor devices and high-definition (HD) multimedia components that require rapid transfers of large amounts of data to and from host memory. The NI PXIe-1082 chassis, the industry's first 3U eight-slot PXI Express chassis with seven PXI Express peripheral slots, complements the generator/analyzers with up to 1 GB/s per-slot bandwidth and up to 4 GB/s of total system bandwidth.

These new instruments expand National Instruments PXI digital test capabilities to provide the performance and flexibility needed to test faster semiconductor chips and multimedia devices requiring high data transfer rates.These PXI Express products will further advance the shift toward more cost-effective test solutions based on the open, off-the-shelf PXI instrumentation standard instead of traditional proprietary solutions.

Because of the advanced operation of the NI PXIe-6544/45 modules, engineers now can accurately and automatically test faster semiconductor devices, such as analog-to-digital converters (ADCs), digital-to-analog converters (DACs), memory devices, ASICs and microcontrollers. Testing a 200 MS/s DAC, for example, previously required a high-speed pattern gener

Newsletter sign-up

The latest products and news delivered to your inbox