Home > NI’s rugged CompactDAQ 4-slot controller enhances measurement accuracy, reduces cost

NI’s rugged CompactDAQ 4-slot controller enhances measurement accuracy, reduces cost

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article image NI’s CompactDAQ 4-slot controller

National Instruments Aust & NZ announces the launch of the CompactDAQ 4-slot controller designed to ensure high accuracy measurements and cost optimised systems.

Designed to integrate the processor, signal conditioning and I/O into a single system, the CompactDAQ 4-slot controller enables engineers and scientists to reduce overall system cost and complexity while increasing measurement accuracy. The integrated measurement systems reduce the number of components, connections and wiring needed, facilitating both accuracy and cost savings.

Key features of the CompactDAQ controllers include an Intel Atom dual-core processor running industry-standard Windows Embedded 7 or NI Linux Real-Time for ultimate system reliability; hot-swappable removable SD storage eliminating data storage limits; integrated CAN/LIN port reducing costs; four C Series module slots to mix and match a variety of I/O types, including AI, AO and DIO to meet specific application needs; and rugged form factor for use in high shock and vibration environments as well as temperatures ranging from -40°C to 70°C.

By pairing industry-standard OS options with LabVIEW system design software, customers can easily port LabVIEW code from existing measurement systems to these new CompactDAQ controllers. Engineers and scientists can combine LabVIEW and over 60 sensor-specific I/O modules for CompactDAQ to quickly customise data acquisition systems to meet their specific application needs.

According to Stefanie Breyer, director of data acquisition R&D at NI, the next-generation CompactDAQ controller has been designed based on customer feedback, making it smaller, less expensive and more rugged. She adds that customers can leverage the latest Intel Atom 3800 processor within the controller to deploy powerful processing paired with high-accuracy measurements anywhere.

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