National Instruments Aust & NZ announces the new NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit.
Offering 10 bits of vertical resolution and a 5 GS/s sample rate, the new NI digitizer provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. The 1.5 GHz of bandwidth and four channels in a single slot make the NI PXIe-5162 suitable for high-channel-count digitizer systems in manufacturing test, research and device characterisation.
The NI digitizer can be used with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimised for performing the high-throughput jitter, eye diagram and phase noise measurements demanded by automated validation and production test environments.
Steve Warntjes, NI director of modular instruments research and development explains that the combination of high-speed, high-channel and high-resolution measurements offered by the NI PXIe-5162 digitizer makes it possible for traditional oscilloscope customers to think beyond traditional box instruments for automated test.
Engineers using the high-speed digitizers with the LabVIEW Jitter Analysis Toolkit can accelerate their measurement systems using the processing power of modern PCs instead of the legacy embedded processors on box oscilloscopes.
NI PXIe-5162 features
- 10 bits of vertical resolution for greater insight into the signal
- Four channels in a single 3U PXI Express slot, expanding to 68 channels in a single PXI chassis
- 5 GS/s maximum sample rate on one channel or 1.25 GS/s on four channels simultaneously
- Built-in functions for clock recovery, eye diagram, jitter, level and timing measurements
- Example programs for eye diagram and mask testing, and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods