Home > LIMF-10 optical thin film measurement instrument from Lambda Scientific

LIMF-10 optical thin film measurement instrument from Lambda Scientific

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article image LIMF-10 thin film measurement instrument

Lambda Scientific’s  LIMF-10 optical thin film measurement instrument can easily determine thin film properties like thin film thickness, refractive index, and extinction coefficient.

LIMF-10 optical thin film measurement instrument functions based on spectral analysis of multi-reflecting beams and can be used for many applications such as optical coatings, photoresists and also with substrate materials (silicon, quartz, germanium, aluminium, etc).

Lambda Scientific’s non-contact thin film measurement instrument has a thickness measurement range of 20nm to 50µm with a resolution of 2nm and is controlled by user friendly software.

LIMF-10 thin film measurement instrument can be easily dismantled and used as a spectrometer with accompanying spectrometer software.

LIMF-10 optical thin film measurement instrument can also connect to a microscope which can reduce the spot size to 10µm from a previous 1.2mm.

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