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CSZ accelerated stress test chambers available from Hylec Controls

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article image CSZ accelerated stress test chambers have a moveable loading ramp for ease of use
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Available from Hylec Controls , CSZ accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. These environmental test chambers have been designed to cycle between 70°C to -20°C at a rate up to 30°C per minute based upon the part temperature.

These accelerated stress test chambers are primarily used for production stress testing of circuit boards, electronic drives, and assemblies. These stress test chambers allow the user to quickly control and change the temperature of the product while the device is powered up.

The accelerated stress test chambers are equipped with a movable loading ramp for ease of use and storage. This allows the user to easily roll in their test rack and store the ramp under the cart rack when not in use.

A variety of ports and fixtures are available as options to accommodate different user interfaces and powering of devices.

These accelerated stress test chambers have a temperature Range of -20°C to 70°C with other temperature ranges also available.

CSZ accelerated stress test chambers also feature:

  • Cycle indicator light 
  • Door interlock safety switch 
  • Dry Air Purge 
  • Fog-free window in the door 
  • Pressure compensation during ramp 
  • Serial communications 
  • Workspace Volume: customized to requirements and number of racks

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