Hach Pacific presents their TSS sc range of probes that can measure on-line Suspended Solids in virtually all applications even under strict regulatory conditions. The TSS sc probes are one family of sensors for all applications. The range includes twelve instrument versions and thirty different mounting styles.
The Hach Pacific range TSS sc probes include:
TSS sc and TSS W sc probes are made of polished stainless steel that is scratch resistant, easy to clean and consists of a sapphire window design that can withstand harsh environments and keeps particles from sticking to the surface. For high solids applications, the TSS W sc is equipped with a wiper to maintain accuracy.
TSS HT sc optics and electrical systems features a special material coating that makes it able to withstand operating temperatures of 90oC and pressures of up to 10 bar without the hassle of flow-through cells or cooling lines. The TSS HT sc optics is ideal an ideal choice for process control.
TSS XL sc and TSS VARI sc probes are specially designed for measurement of Suspended Solids under the high hygienic requirements of the food, beverage and pharmaceutical industry. The probes feature an aseptic process connection that is achieved with the installation of the Varivent or XL in-linehousing. The acid, alkali-proof and high temperature stable materials help facilitate the use of the probe under CIP conditions.
TSS Titanium is currently the only titanium suspended solids probe in the market that is designed to provide process control in the most difficult environments and extreme applications. The titanium probe offers the same high quality measuring properties as the TSS sc.
TSS EXI sc probes are designed for measurements in hazardous locations with Class 1 Div 2 requirements. Depending on the application, it is possible to select either an immersion style or insertion style probe.
The range of Hach Pacific TSS sc probes can measure both on-line Suspended Solids and Turbidity in one instrument. The TSS sc probes offer the flexibility to enable the measurement of both parameters under the same application.