FOSS has introduced the new XDS MasterLab, the latest analytical solution featuring XDS near-infrared (NIR) technology, for rapid non-destructive measurements of tablets, solids and liquids.
The XDS MasterLab features automated, unattended reflectance of transmission analysis of a tray of multiple tables or vials. Simply load the tray, insert it into the XDS MasterLab and let the movable (X-Y) sampling mechanism properly position and analyse each tablet/vial.
An integrated variable spot-size feature enables the sample illumination to be adjusted based on the diameter of the tablets/vials being used. The sample centering iris is provided for single sample analysis, while the optional coarse granular cell extends analysis to virtually any solid form from fine powders to coarse granular materials, pellet and flakes.
XDS NIR technology offers superior analyser performance with increased sensitivity and instrument matching to enhance method development, minimize implementation time and ensure seamless method transferability.
FOSS NIRSystems provides a complete range of rapid scanning, near infrared spectrophotometers for laboratory and process applications.