FOSS’ new MultiVial Analyser features automated, unattended reflectance analysis of a tray of multiple vials.
Simply load the tray, insert it into the MultiVial Analyser and let the movable (X-Y) sampling mechanism properly position and analyse each vial.
An integrated variable spot-size feature enables the sample illumination to be adjusted based on the diametre of the vials being used.
The sample centering iris is provided for single sample analysis, while the optional coarse granular cell extends analysis to virtually any solid form from fine powders to coarse granular materials, pellet and flakes.
XDS NIR technology offers superior analyser performance with increased sensitivity and instrument matching to enhance method development, minimise implementation time and ensure seamless method transferability.