Home > ZEISS Crossbeam sets new standards in 3D nanotomography, nanofabrication fast materials processing and hi-res imaging

ZEISS Crossbeam sets new standards in 3D nanotomography, nanofabrication fast materials processing and hi-res imaging

Supplier News
article image ZEISS Crossbeam

Carl Zeiss Pty Ltd announces the first system of the new ZEISS Crossbeam series that enables time-intensive 3D experiments to be completed overnight.

First introduced at the MC 2013 in Regensburg, Germany, the ZEISS Crossbeam series delivers high speed in materials analysis and processing, and can be used in diverse applications. 

The newly developed focused ion beam (FIB) column enables fast and precise materials processing that can be observed with the field emission scanning electron microscope in real-time. High resolution over the entire voltage and current range allow users to work quickly and precisely. 

Designed for stability, the system ensures reproducible results even in long-term experiments. The field of application is expanded by the optionally available Massive Ablation Laser that rapidly prepares samples to access deeply buried regions of interest. 

Suitable for use in both materials and life sciences, the Crossbeam benefits materials scientists with excellent 3D analytics, the ability to image magnetic and non-conductive specimens with maximum resolution, and from the unique materials contrasts.

Bioscientists can use Crossbeam for fast tomography series with high Z resolution in cell and tissue biology. The modular design of Crossbeam makes it an open 3D nano workstation that can be configured and field-upgraded for a broad spectrum of applications, offering the user maximum flexibility.

The microscope system is available in two versions: the Crossbeam 340 and Crossbeam 540. 

The GEMINI I VP (variable pressure) column of Crossbeam 340 offers optimal analysis conditions for in situ experiments with outgassing and charging specimens. The GEMINI II column with double condenser system, Crossbeam 540 benefits users by providing more information in a shorter time. The system delivers high resolution, even with low voltage and high beam current, enabling fast analytics and ease of use.

Newsletter sign-up

The latest products and news delivered to your inbox