ANRITSU has introduced the S810C and S820C microwave Site Master models that provide an accurate and convenient method for installing, verifying, troubleshooting, and repairing microwave communication systems operating up to 20GHz.
Utilising vector error correction, the S810C and S820C provide improved measurement quality and convenience compared to traditional scalar techniques.
The analysers also have an extremely high immunity to live site RF interference that allows users to conduct highly accurate measurements of active sites, including co-location sites.
Both the S810C and S820C deliver accurate, reliable, and repeatable Return Loss/SWR and Fault Location measurements.
The Site Masters have a return loss range of 0 to 54dB with 0.01dB resolution and 517 data point display resolution to locate long-range problems.
A full range of marker and limit functions is also designed into the analysers to facilitate quick and comprehensive measurements.
To make waveguide measurements, the S810C and S820C use a small coaxial-to-waveguide adapter rather than a bulky coupler.
Site Master's waveguide calibration components are built with precision alignment pins that mate the companion coaxial-to-waveguide adapters to ensure proper waveguide alignment.
Further, the analysers have a clearly defined user interface for coaxial cable and waveguide media, as well as pop up menus providing both standard and custom cable or waveguide lists.
The S810C and S820C easily analyse antenna system performance, trends, and problems in the field; with separate Windows-based data analysis software (included with each Site Master), users can easily analyse the antenna system performance, trends, and problems in their PC.
With this software, measurement traces can be uploaded and downloaded between the PC and the S810C and S820C via a single menu selection.
The trace data can then be used for comparison to historical performance to evaluate trends so minor problems can be corrected before they become costly system failures.
The Site Masters' menu-driven interface requires little training and simplifies deployment.
As many as ten test set-ups can be stored for fast repeatable testing, and up to 200 measurement traces can be stored in a non-volatile memory.