INFINEON Technologies has chosen Agilent's semiconductor parametric test (SPT) systems for production testing of silicon wafers used in memory devices. The test systems will be used in Infineon's Dresden, Germany, facility as the company moves towards volume production of 300mm silicon wafers.
Infineon, one of the top 10 semiconductor manufacturers globally and one of the three biggest in Europe, has ordered several Agilent 4072A Advanced Parametric Test systems as part of a two-year, multi-system purchase for its 300mm production line.
The Agilent 4072A will provide an all-in-one solution that meets advanced semiconductor process needs by providing high throughput, production parametric test, ring oscillator measurement, flash cell evaluation and advanced wafer level reliability (WLR) tests.
"We are using Agilent test systems because of their track record for performance and reliability on our production line," Peter Kucher, Infineon vice president and managing director, said.
"The system's extremely precise measurement capability and high throughput allow Infineon to reduce its cost of test to keep pace with fast eroding memory chip market prices." Agilent 03 9210 2824.