Home > N9080A LTE measurement application for Agilent Technologies' X-Series of signal analysers

N9080A LTE measurement application for Agilent Technologies' X-Series of signal analysers

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article image X-Series measurement application automates LTE measurements

Agilent Technologies  have introduced N0908A LTE measurement application for their X-Series of signal analysers.  

The N0908A LTE measurement application provides comprehensive embedded solution with hardkey/softkey and SCPI programming user interface and brings physical layer testing of uplink (UL) and downlink (DL) LTE signals to the test rack.

When coupled with the speed of X-Series analysers, the N0908A LTE measurement application is suitable for use in automated testing during design validation and prototype production.

The N9080A LTE measurement application, along with the X-Series analysers, provides a more complete picture of LTE signal problems and their causes for better, faster design troubleshooting.

It offers the same feature set as the LTE option found in Agilent Technologies’ 89600 Vector Signal Analysis (VSA) software and also puts comprehensive LTE signal analysis in the test rack with familiar automation tools like SCPI programming and LAN/LXI compatible interfaces.

As a result, the designing engineer can spend more time validating designs and implementing tests, and less time learning programming tools and instrument interfaces.

By complying with the 3GPP LTE standard, the N9080A LTE measurement application enables effective analysis of UL and DL LTE signals, including single-channel MIMO analysis, in a single option.

Engineers can make transmitter measurements on eNB (base station) and user equipment (mobile station) compared to other commercially available LTE software.

The N9080A LTE measurement application supports all LTE bandwidths and modulation formats as per the 3GPP TS 36 standards. Specific modulation quality measurements include EVM per OFDM carrier, EVM per OFDM symbol, EVM per slot and EVM per Resource Block.

These measurements help identify EVM performance per user, per radio frame, per sub-frame, per slot, per resource block and per symbol. Selective analysis by channel, subcarrier or symbol helps the engineer troubleshoot and uncover previously unseen errors.

According to Guy Sene, Vice president of Agilent Technology's Signal Analysis Division, measurement flexibility and speed are key requirements for R&D, design validation and production engineers.

The N9080A LTE measurement application features a well-designed user interface, including four simultaneous, user-selected displays. This saves the engineer time by displaying desired measurements without switching.

Marker coupling among multiple traces and colour coding by channel type speeds the process of tracking an error from the constellation through the multiple EVM traces.

The 89600 VSA software, with an LTE option, can be used with several Agilent Technologies’ products to implement LTE measurement anywhere in the block diagram, from baseband to antenna, on digitised or analogue signals, using spectrum and signal analysers, oscilloscopes and logic analysers.

Measurements can also be made on simulated designs created with the Agilent EEsof Advanced Design System.

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