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Enhancing semiconductor parameter analysis using faster pulses

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article image Semiconductor parameter analyser

Agilent Technologies  has announced source/monitor unit (SMU) and software enhancements to its B1500A semiconductor device analysers.

An industry-leading semiconductor parameter analyser, the new B1514A 50-µs pulse medium-current SMU gives a faster pulse at 30V/1A range in addition to oscilloscope-like viewing while the new B1511B medium-power SMU delivers 0.1 fA low-current measurement capability at a lower price with an optional atto-sense switch unit.

The latest EasyEXPERT 5.5 software supplied with the analyser enables remote test without complex programming, using more than 300 ready-to-use application tests.

Having consistently delivered parametric test performance and value since early 1980, when the company introduced its digital parametric analysers, Agilent continues the tradition with the new B1500A, which supports all aspects of characterization for IV (0.1 fA - 1 A/0.5 µV - 200 V), capacitance (1 kHz - 5 MHz) and ultra-fast pulsed/transient IV measurement down to ns order.

The Agilent B1500A semiconductor parametric analysers with the new B1514A and B1511B SMU modules and EasyEXPERT software enhancements offer a complete device characterization solution with versatility, uncompromised measurement reliability, and efficient, repeatable measurements. The B1500A series supports all state-of-the-art measurements for parametric test, enabling electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device.

Enhancements for the B1500A semiconductor device analysers

Faster pulsed measurements using the B1514A, a 50 µs pulse medium-current SMU

Enabling a pulsed measurement down to 50 µs pulse width, a 10X or more narrow pulsed measurement than provided by a comparable conventional SMU, the analyser offers wider range and versatility, up to 30 V/1A, with voltage/current programmability. Pulsed IV measurements are typically required to characterize today's advanced materials and devices. The EasyEXPERT oscilloscope view is supported for the B1514A to monitor the actual voltage and current waveform, enabling users to confidently verify the pulsed measurement setup and optimise its parameters quickly and easily.

Very low current measurement down to 0.1 fA at lower cost

The new B1511B medium-power SMU with an atto-sense and switch unit can be used to meet the requirements for accurate low-current characterization, such as leakage current in order to accelerate research and development for next-generation devices.

Easy device characterization with EasyEXPERT 5.5

The updated software features remote control to execute the built-in application test, GUI to control switching matrix, and extension of the application library. The software also supports the oscilloscope view for the B1514A 50 µs pulse medium-current SMU. EasyEXPERT is a GUI-based software operating on Windows 7, and offers efficient and repeatable device characterization ranging from interactive manual measurements to semi-automated wafer tests.

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