Home > Agilent Technologies’ parametric test systems win EuroAsia 2008 IC Industry Award

Agilent Technologies’ parametric test systems win EuroAsia 2008 IC Industry Award

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Agilent Technologies ’ new family of parametric test systems, the Agilent 4080 Series, received the EuroAsia 2008 IC Industry Award for Final Manufacturing - Best Tool.

The EuroAsia IC Industry Awards, sponsored by EuroAsia Semiconductor magazine, recognise excellence in integrated circuit (IC) manufacturing. Winners are selected based on ballot voting from industry peers. The awards focus on the people, processes and products that drive the industry forward. Voting is open to all companies, individuals and organisations within the IC industry.

Agilent Technologies’ 4080 parametric test systems family is a superset of the previous 4070 series of test systems that combines the accuracy and reliability of the previous generation with significantly higher throughput. The 4080 Series is used extensively in several major semiconductor companies in the manufacturing function.

The 4080 parametric test platform has been designed to be versatile, flexible and scalable so as to suit a variety of measurement types such as parallel test, Flash memory cell read/write/erase testing and RF S-parameter characterisation.

Minoru Ebihara, Vice President and General Manager of Agilent Technologies’ Hachioji Semiconductor Test Division, sees the award as an acknowledgement of the product’s advanced capabilities by the company’s customers and peers in the semiconductor industry.

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