Agilent Technologies has introduced two FET single-pole double-throw (SPDT) solid-state switches for switching RF signals up to 18 GHz. Low video leakage, high isolation and a good settling time make the FET single-pole double-throw (SPDT) solid-state switches well suited for semiconductor manufacturing system test and R and D engineers, and enable the high-performance broadband switching required to validate RFIC component performance.
The Agilent U9397A and U9397C FET switches operate from 300 kHz to 8 GHz and 300 KHz to 18GHz, respectively. In contrast to a conventional PIN switch, which has a typical video leakage of 1,000 mVpp, Agilent's new FET switches have inherently low video leakage of less than 10 mVpp. While not a considered parameter, video leakage can cause significant damage to sensitive components and devices under test. Agilent's FET switches are crucial for enabling not only accurate but also safe broadband testing of components and devices such as mixers and amplifiers.
The new FET switches also incorporate a patented design that results in one of the industry-leading settling time of less than 350 microseconds measured to 0.01 dB. The fast settling time improves throughput in high-speed RFIC manufacturing test. Another key characteristic of the FET switches is high port-to-port isolation, specified at greater than 90 dB. Such isolation minimises crosstalk between signal paths to ensure accurate testing and better yield.
According to Agilent, its FET solid-state switches employ an innovative design that combines high-speed capability with broadband performance and low video leakage. A good performance and flexibility of its FET switches allows manufacturing and R and D engineers to address the challenges of measurement accuracy, throughput and yield.