Home > Agilent Technologies' N9201A Array Structure Parametric Test Solution wins Semiconductor International’s Best Product Award

Agilent Technologies' N9201A Array Structure Parametric Test Solution wins Semiconductor International’s Best Product Award

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article image Array Structure Parametric Test Solution

The N9201A Array Structure Parametric Test Solution, available from Agilent Technologies , has won the Semiconductor International 2008 Editor's Choice Best Product Award for excellence in semiconductor manufacturing.

The Editor's Choice Best Product Award recognises products that have been acknowledged by users for providing high performance and capabilities in semiconductor manufacturing.

The N9201A Array Structure Parametric Test Solution, which reduces the time engineers need to optimise process parameters and maximise yields, has been accepted by customers ramping up advanced semiconductor technologies.

The N9201A Array Structure Parametric Test Solution speeds up the yield ramp-up phase by allowing engineers to test more structures in less time and with higher throughput. It provides fast parallel measurement of array test structures (both passive and addressable), reducing the time engineers need to optimise process parameters and maximise yields.

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