Agilent Technologies introduces a new range of high-precision pulse function arbitrary noise generators designed to help R&D and test engineers test higher speed, higher bandwidth devices.
The new pulse function arbitrary noise generators are used to test high speed and high bandwidth analogue, digital and mixed-signal devices more efficiently and with greater precision.
Shorter design schedules and higher quality goals increase pressure for design and test engineers to get their products to market faster.
Additionally, they must differentiate their products in the marketplace by offering unique capabilities, which necessitates expanded test functionality during development.
The Agilent 81160A pulse function arbitrary noise generators provide innovative functionality and streamlined setup to help engineers complete a broader test set more quickly.
According to Jurgen Beck, general manager of Agilent's Digital and Photonic Test product line, their test tools help engineers do their jobs as efficiently and effectively as possible with their pulse pattern generators offering innovative features to accelerate test for device design.
Key features of Agilent 81160A pulse function arbitrary noise generators:
- Eliminates the need for cumbersome multi-instrument setups for stress testing devices
- Provides versatile waveforms along with superior signals with an intrinsic jitter of 7 ps rms
- Helps engineers define better performance specifications for their devices
- Ideal for general-purpose bench tests and advanced serial data stress tests
Key capabilities include:
- Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution
- Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards
- Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs, enabling continuous operation without rebooting or resetting the device under test
- Arbitrary bit patterns show capacitive load of the channels using simple pattern settings
- Complex measurement setups are no longer necessary to test designs to their limits