Agilent Technologies Inc. has released that it has shipped its 8.4 software release with enhanced capabilities for the Medalist 5DX Automated X-ray Inspection (AXI) system.
End-users of the industry-leading 5DX can benefit from the following major AXI enhancements:
- Specialised new algorithm, allowing for inspection of quad-flat no-lead (QFN) with reduced false call rates;
- Defect characterisation on non-wetted Direct FET (field-effect transistor) by using an open slope paste test, which was not possible previously; and
- A new threshold that enables end-users to inspect for solder presence along the side edges of a capacitor, in addition to the current capability for inspection at the ends of a capacitor.
According to NBS Design, this release brings with it not just bug fixes but real enhancements to the 5DX platform. NBS Design has been working with the new QFN algorithm extensively and have caught some defects with this new algorithm family. NBS Design is also using the new additions to the paste algorithm family and consider it as another powerful addition to the 5DX inspection capabilities.
Agilent's 8.4 software release demonstrates the company's continued innovation and commitment to improving X-ray inspection.